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DIRECTED
ENERGY
PROFESSIONAL
SOCIETY
Abstract: 24-Systems-227
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UNCLASSIFIED, PUBLIC RELEASE
US Army SMDC Integrated Electro-Optic Probe System for Non-Perturbative, Electric Field Measurements
To support high power microwave testing, electric field measurements are a critical diagnostic to characterize intended effects on targets or experiments. For far-field measurements in free-space, D-Dot probes, coupled with digital or analog integration, are a well-known method of measuring the electric field. The simple geometric construction and operating principle makes them a reliable method for measuring electric field. For testing needs that require near-field, minimally perturbative, or measurements inside of DUTs, D-Dot probes are not suitable due to their metallic and electrically grounded construction. Electro-Optic (EO) probes, which are completely made of dielectric materials, are a method of making minimally invasive electric field measurements. Because the correlation between electric field and optical modulation is inherently a nonlinear optical phenomenon, EO probes can suffer from high noise problems. This makes commercial EO probes suitable for high electric field strength time domain measurements or low electric field, frequency-domain measurements. These commercial probe systems often require additional data recording and calibration systems to be used in conjunction. In partnership with the SMDC HPM effects laboratory, Radiance Technologies has developed an all-in-one, semi-ruggedized 4-channel EO probe field measurement system. This system makes an order of magnitude improvement on peak-to-peak noise floor of the electric field, reducing the temporal noise floor to 5 kV/m. Additionally, it incorporates frequency compensated calibration factors. This presentation covers the design philosophy, calibration techniques, and tested performance of the 4-channel EO probe system.
UNCLASSIFIED, PUBLIC RELEASE
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